Invited Speakers

	Prof. Dr. Stelian Brad Technical University of Clj-Napoca, Romania

Prof. Dr. Stelian Brad is a leading European expert in artificial intelligence, innovation engineering, and robotics, known for pioneering the intersection of technology, creativity, and societal impact. With a career spanning over three decades, he serves as Full Professor at the Technical University of Cluj-Napoca, where he leads research and doctoral programs in intelligent robotics, AI-assisted design, and innovation management.
He is the Dean of the Faculty of Industrial Engineering, Robotics and Production Management of the Technical University of Cluj-Napoca, the President of Cluj IT Cluster, representing over 100 tech companies and 17 universities, and the driving force behind DIH4Society, a Digital Innovation Hub advancing AI, cybersecurity, and smart transformation across Central and Eastern Europe. Prof. Brad is also the former President of the European TRIZ Association (ETRIA) and co-founder of ISAIII - the International Society for AI-powered Invention and Innovation.
An entrepreneur, he co-founded several IT companies (e.g. ArtSoft, softexxplorer) and recently cyberGEIGER, a German cybersecurity startup, and led over 150 R&D and innovation projects, including in Horizon Europe and FP7. He is a frequent keynote speaker on the future of AI, innovation ecosystems, and smart manufacturing, and the author of over 260 scientific papers and multiple books on robotics, innovation, and competitiveness. Honored by the Romanian Academy and several international institutions, he is a recognized voice shaping Europe's digital and industrial transformation.

Keynote Paper: REINVENTING QUALITY CONTROL THROUGH AI SEMANTIC METROLOGY AND COGNITIVE ROBOTICS

Abstract: As manufacturing enters the era of intelligent automation, traditional paradigms of measurement and quality assurance are being challenged by the complexity, speed, and adaptivity of modern production systems. In this keynote, we explore a transformative shift from static tolerancing and post-process inspection to AI-enhanced, cognitive quality control systems that interpret, learn, and adapt in real-time. Drawing on decades of interdisciplinary experience in robotics, innovation engineering, and artificial intelligence, I introduce the concept of Semantic Metrology- a novel approach where measurement data is no longer treated as isolated numerical outputs, but is embedded in knowledge graphs, ontologies, and causal models to enable machine reasoning and automated decision-making. Through real-world examples involving robot-assisted inspection, AI-driven digital twins, and adaptive measurement architectures, we examine how quality becomes a dynamic and context-aware function of manufacturing systems. The keynote will also unveil how TRIZ-inspired AI models can drive the inventive reconfiguration of metrology devices, enabling rapid innovation in constrained environments like nano-measurement, collaborative robotics, and biomedical manufacturing. This vision positions quality not as a checkpoint, but as a self-evolving cognitive capability, reshaping the future of data-driven manufacturing.

	Prof. Satoru Takahashi The University of Tokyo, Japan

Prof. Satoru Takahashi received his MS and Ph.D. degrees from the Osaka University, Japan in 1995 and 2002, and became an associate professor at the University of Tokyo (UTokyo) in 2003. He is currently a professor at the Department of Precision Engineering, UTokyo. In parallel, he was appointed as a visiting professor at the University of Toronto (UToronto), Canada in 2011. His research interests include the nano-in-process measurement, nano-scale-metrology, and nano/micro microfabrication using the advanced optics based on not only far-field optics but also localized photon energy such as evanescent light, near-field light, and so on. Throughout his career, he delivered over 50 invited talks, received 30+ academic awards, and actively engaged in academic association management. He has played leadership roles in not only domestic academic societies, including a Board of JSPE (Japan Society for Precision Engineering), but also international academic societies, including a Board of ASPEN (Asian Society for Precision Engineering and Nanotechnology), Editorial Boards of the ISNM (International Society for NanoManufactruring), and of the IJPEM (International Journal of Precision Engineering and Manufacturing). He's a member of various academic societies including the JSME, JSAT, ASPE, euspen, and a fellow of JSPE, ISNM, CIRP.

Keynote Paper: TBA

Abstract: TBA

 

	Prof. Yasuhiro Takaya The University of Osaka, Japan